题目:Secondary ion mass spectroscopic analysis of copper migration at the copper/polyimide interface
链接:http://scitation.aip.org/content/avs/journal/jvstb/18/1/10.1116/1.591191
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作者:Miki N, Tanaka K, Takahara A, et al.
文题:Secondary ion mass spectroscopic analysis of copper migration at the copper/polyimide interface
期刊:Journal of Vacuum Science & Technology B, 2000, 18(1): 313-316.